Welcome to the 4th International EJC-PISE Workshop

"Surface and Thin Films - Analytics and Diagnostics"

Important Dates:

This workshop is organized by the EJC/PISE Committee in cooperation with the European Society on Thin Films EFDS. The event is organized jointly with the EMPA in Zürich.

Program & registration form [PDF]

Scope

Surfaces and their specifically designed properties are nowadays integral parts of a very wide range of products. Knowing what is at a surface is a prime prerequisite for designing and controlling the functional behavior of such surfaces. Today a broad variety of surface analytical techniques are available, which provide targeted and detailed insights into the chemical and structural properties of surfaces and thin films. They are indispensable tools for the successful development of surface treatments and coatings.

EFDS and EMPA are co-organizing this workshop that will provide you with an overview of the most important techniques for surface and thin film characterization. These are notably

• Ion beam analysis (RBS, ERDA, NRA)
• XPS (ESCA)
• ToF-SIMS
• Electron microscopy (STEM, SEM)
• Scanning probe microscopies (AFM, STM, MFM)
• XRD and X-ray tomography
• Surface mechanical properties (hardness, modulus)

The speakers of this seminar, coming from industry as well as from academia in three different countries, are leading experts in their fields, every one of them with decades of experience in applied surface analysis. As this workshop addresses primarily practical issues of surface analysis, the presentations will contain many examples on how the presented techniques are applied to solve problems in producing surfaces and coatings for specific applications. After each presentation of 60 minutes there will be sufficient time for discussing various aspects.
The breaks and the dinner on the first day will provide ample opportunities for exchange and in-depth discussions.